Abstract
We propose a method of moments (MoM) matrix assembly method for electromagnetic scattering analysis of large-scale complex materials composed of impedance and dielectric media. Material information is assigned to each triangular mesh of the discretized surface, and the interaction among the meshes is calculated. If several meshes are assigned to one edge, the half-Rao-Wilton-Glisson (RWG) basis function is used to calculate the Z matrix elements. Iterative physical optics (IPO) analysis is performed based on the local tangential approximation for the scatterer surface and the appropriate reflection coefficient of each mesh. The numerical accuracy is verified by comparing the proposed MoM and IPO results with those of the commercial tools FEKO and CST Studio Suite.
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