Abstract
Often measurement tasks occur, where specimens consist of multiple layers or topography shall be examined through contaminations. Especially for unknown layer materials, it is important to measure the layer's refractive index to compensate for the errors induced on the measurement of underlying surfaces. Chromatic Confocal Coherence Tomography is proposed as a new hybrid single-shot scheme for a simultaneous measurement of thickness and refractive index of semitransparent layers, combining chromatic confocal and interferometric information. As a proof of concept, first measurements are presented along with a short discussion about their uncertainties, where minimal layer thickness and resolution are dominated by the confocal part of the signal, that is mainly influenced by the chosen microscope objective.
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