Abstract
An inverse algorithm is developed to reconstruct multi-dimensional surface heat flux using transient surface temperature measurements provided by narrow-band thermal liquid crystals (TLC) or phase-change material (PCM). In this thermographic technique, the information provided is the time it took a certain location to reach the characteristic temperature of the TLC or PCM. A quadratic functional to be minimized is formulated. The Levenberg-Marquardt method and genetic algorithms are used to minimize the functional. It is shown that GA's can be used successfully to retrieve surface heat flux distributions with significant error in input times to arrival at the TLC or PCM critical temperature.
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