Abstract
Multi-charged ions of rare gas toms have been measured in coincidence with a photoelectron from a core orbital using a time-of-flight mass spectrometer combined with an electron energy analyzer of the spherical mirror type. Probability ratios obtained for double Auger processes of Ar 2p, Kr 3d and Xe 4d hole states have confirmed that those estimated from previously observed ion yield spectra around core-ionization thresholds are correct. These ratios for spin split states in Ar 2p and Kr 3d holes were found to be almost the same, although those in Xe 4d hole states are different.
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More From: Journal of Electron Spectroscopy and Related Phenomena
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