Mueller matrix determination for one-dimensional rough surfaces with a reduced number of measurements

Abstract

We apply the direct method of Mueller Matrix Ellipsometry (MME) to measure the Mueller matrix associated to a one-dimensional (1-D) rough surface. We show that for a 1-D surface, the complete Mueller matrix can be determined with four different intensity measurements, instead of six as actually are reported. The experimental Mueller matrix elements obtained for a 1-D random rough, metallic surface, by the reported method are undistinguishable from the measured by using our method.