Abstract

Use of the (M,S) criterion to select and classify factorial designs is proposed and studied. The criterion is easy to deal with computationally and it is independent of the choice of treatment contrasts. It can be applied to two-level designs as well as multi-level symmetrical and asymmetrical designs. An important connection between the (M,S) and minimum aberration criteria is derived for regular fractional factorial designs. Relations between the (M,S) criterion and generalized minimum aberration criteria on nonregular designs are also discussed. The (M,S) criterion is then applied to study the projective properties of some nonregular designs.

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