Abstract
This paper presents the parallelization of a pattern simulation algorithm for Imaging Interferometric Lithography (IIL), a Very Large Scale Integration (VLSI) process technology for producing sub-micron features. The approach uses Message Passing Interface (MPI) libraries [1]. We also discuss some modifications to the basic parallel implementation that will result in efficient memory utilization and reduced communications among the processors. The scalability of runtime with degree of parallelism is also demonstrated. The scalability of runtime with degree of parallelism is also demonstrated. The algorithm was tested on three different platforms: IBM SP-2 running AIX, SGI Onyx 2 running IRIX 6.4, and a LINUX cluster of Pentium-233 workstations. The paper presents the results of these tests and also provides a comparison with those obtained with Mathcad (on Windows 95) and serial C (on Unix) implementations.
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