Abstract
The occurrence of higher-order Fourier components in an originally sinusoidal free-carrier index grating produced in CdS by interference of two picosecond light pulses is demonstrated by simultaneously monitoring the decay of the first- and second-order diffraction intensity of a transparent probe pulse. A pronounced contribution with doubled period can be attributed to an exciton phase grating formed by binding of electrons and holes of the free-carrier grating.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
