Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique

Abstract

This research proposes a motion-induced error reduction method for phase shifting profilomtry. Particularly, each illuminated fringe pattern will be captured twice in one projection cycle when imaging a highly dynamic scene, resulting in two sets of phase shifted fringe images be obtained. A phase map will be computed for each phase shifting set in preparation for error analysis. Finally, motion-induced phase errors will be compensated by examining the difference of the two phase maps obtained respectively from two phase shifting sets. This method uses defocused 1-bit binary patterns to bypass rigid camera-projector synchronization, which has potential for high-speed applications.