Abstract

The results of statistical modeling of the discrete process of multiple inelastic scattering are presented. This process is modeled to find the most probable and average energy losses of a beam of charged particles (electrons and protons) passing through a material layer with a given thickness. The proposed approach is based on determining the most probable energy loss at single small-angle scattering, on including the effect of the statistical probability on this quantity at multiple scattering, and on determining the average number of inelastic interactions for particles in a film with a known thickness. The dependence of the particle energy lost during interaction with atomic electrons on their relative motion is taken into account for low-energy particles. A new interpretation is offered for the parameter J in the logarithmic term in the formulas for the average and most probable energy losses of charged particles. A computational scheme for this parameter as an average potential energy of atomic electrons is given.

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