Abstract

The platform of ArF resin has been developing for several generations. ArF resin of each generation had to improve their character for the satisfaction of lithographic performance. Nowadays, we need the characters of good transmittance, resolution, relatively high etch resistance, Low line width roughness(LWR), in some cases, good resist reflow process (RFP). To solve these needs, we tried to approach in the view of morphology and physical properties of ArF resin. First of all, we performed polymer modeling with simulation, and also carried out actual synthesis. It was concluded that we did make a comparison between result of simulation and actual synthesis.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.