Abstract

The structure and the mechanical properties of polyamide (PA) films were studied with scanning force microscopy (SFM). The spherulitic structure of the films was resolved and the amorphous and crystalline regions could be identified without heavy metal staining or evaporation. The identification was achieved with different contrast mechanisms in SFM, such as the force modulation technique and phase imaging. The mechanical properties of the PA films were investigated with a tensile tester. The films were drawn in a uniaxial direction. The deformation of the spherulite structures could be imaged by in situ SFM. A schematic model for the interpretation of the observed structures is presented.

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