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Abstract
The effect of morphological structures and optical band gap of (1-x)ZnAl2O4xSiO2samples with compositions ofx= 0.00, 0.05, 0.10 and 0.15 were prepared by sol-gel method. Spin coating technique was used to deposited the (1-x)ZnAl2O4xSiO2as a thin film and to investigate the structural and optical band gap. The produced thin film samples were annealed at 450 °C for 1h. Field emission scanning electron microscope (FESEM) was used to investigate the surface morphology of the samples. The average particle size for (1-x)ZnAl2O4xSiO2is about 331.23 nm. The particle size are tend to increase as the composition of SiO2increased. XRD analysis shows the formation of cubic structure phase and dominant peak has been observed with Miller Indices (311) plane. The average crystallite size,Dwas calculated with average size about 8 13 nm. The optical band gap was calculated for (1-x)ZnAl2O4xSiO2samples and it was found within range of 3.34 to 3.94 eV.
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