Abstract
The morphology of CdS-indium tin oxide (ITO) and CdS-ZnO bilayers has been investigated by atomic force microscopy in order to obtain a better understanding of their behaviour as window coatings in solar cells. Chemical bath-deposited CdS layers with t hicknesses ranging between 0.05 and 0.12 μm and RF-magnetron-sputtered ITO and ZnO films have been independently analysed before the study of the combined materials. A CdS thickness below 0.1 μm has been found to be optimal for avoiding the adhesi on of large solution particles from the chemical bath, and thus for achieving a homogeneous CdS layer useful as a polycrystalline substrate to improve the transparent conductive oxide (TCO) grain size.
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