Abstract
Nanoclusters of Ge, such as hut clusters and pyramidal clusters, were grown on Si(001) substrates and evaluated by surface electron diffraction methods such as reflection high-energy electron diffraction (RHEED) and low-energy electron diffraction (LEED). Observations of the same sample by both RHEED and LEED were carried out for the first time. The diffraction spots had a characteristic shape and intensity distribution depending on the morphology of the clusters. The spot shapes in RHEED and LEED were simulated by kinematic calculations, which reproduced the experimental results fairly well. It was confirmed that the characteristic spot shapes can be explained by refraction effects and Laue function of diffraction intensity. [DOI: 10.1380/ejssnt.2012.18]
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
