Abstract

Two-dimensional materials like graphene and boron nitride find applications in numerous innovations thanks to their high specific surface area and unusual electrical, thermal and optical properties. These materials are often produced via liquid-phase exfoliation, yielding nanoplatelets with a high degree of polydispersity. Unfortunately, methods for the characterization of both lateral dimension and thickness for dispersed polydisperse nanoplatelets are still lacking. In this work, a fast and quantitative method for the characterization of polydisperse nanoplatelets in dispersion is proposed using the example of graphene nanoplatelets (GNPs). The method is benchmarked using well-defined gibbsite nanoplatelets. Synchrotron small-angle X-ray scattering (SAXS) is used to probe the structure of the platelets over a wide range of length scales. The SAXS data are fitted with a polydisperse form factor for discs, which yields size distributions in both thickness and diameter. Benchmarking the procedure with the gibbsite model system shows excellent agreement between the SAXS results and previous transmission electron microscopy and atomic force microscopy data. The method is also successfully applied to GNPs from 1–60 layers in thickness and 20–2000 nm in diameter. We believe that this work brings reliable quantitative in situ characterization, for instance during preparation, of nanoplatelet dispersions within reach.

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