Abstract
ABSTRACT The surface morphology and microstructural characteristic of ZnTe, CdTe and ZnS thin films obtained by close-spaced sublimation technique were investigated. The structural features of layers were examined by XRD, SEM and optical microscopy. Size of coherent scattering regions, lattice microstrain and stacking fault defect concentration were estimated from X-ray diffraction line broadening. The investigation performed elucidates effect of preparation conditions on main structural characteristics of ZnTe, CdTe and ZnS thin films.
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