Abstract
Hitachi Scientific Instruments has launched a scanning electron microscope (SEM), which combines the convenience of an optical microscope with the high resolution of a top grade SEM. Whereas traditional SEMs only work at high vacuum, the ‘Universal’ SEM achieves outstanding resolution at low and high vacuums making it the most versatile multipurpose microscope available for quality inspection and advanced research of surface coatings, paints, pigments etc. It can be used to measure the thickness of coatings, determine faults and provide information for product improvement or trouble shooting.
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