Abstract
Abstract There was a recent thread on the microscopy listserver by John McCaffrey (who hosted the discussion on TEM calibration at the 2001 M&M facility managers session) and Richard Beanland, dealing with the calibration of TEMs. This discussion was prompted by a calibration question from John Basgen, who was looking for more precision and more long-lived calibration specimens. The discussion complements and extends the one of the M&M 2001 managers meeting on EM calibration (Microscopy Today, January/February 2002, issue #02-1), and we are running this separately from that meeting discussion. (MT-ed.)
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
