Abstract
The present work incorporates a two dimensional Monte Carlo based polycrystalline simulation analysis for ferroelectric thin films. In the two stage process; first, grain growth is simulated via a traditional Q-State Monte Carlo method, taking into account isotropic grain boundary energies. Second, the grain growth results are incorporated within an electric polarization model, combining contributions from a three component Hamiltonian, including the electrostatic potential, nearest neighbor electrical interactions, and electrostatic energy. Among other findings, the results suggest a strong correlation between electric polarization and grain size, particularly at relatively large electric field frequencies.
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