Abstract
A Monte Carlo model was established to simulate polarized scattering fields of two-dimensional rough surfaces based on the Kirchhoff approximation. Based on this model, numerical studies of the hemispherical distribution of Stokes vectors of scattered light from dielectric and metal rough surfaces were carried out. These surfaces have Gaussian distributions with correlation length of 3.1 µm and standard deviation varying between 0.1 and 0.6 µm. The results reveal that the V component of metal surfaces has peaks antisymmetric with the incident plane, whereas the V component of dielectric surfaces is almost zero. We consider that this property of the V component would provide a new method which could be used to distinguish the target material.
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