Abstract
AbstractThe error introduced by sample scattering in EDXRF analysis is evaluated by Monte Carlo simulation. This is accomplished by deriving a Monte Carlo model capable of simulating single Compton and Rayleigh scatters from the exciting photon source and from fluorescent X rays in homogeneous samples. The model also includes primary, secondary, and tertiary fluorescence events. (1) Results are given for Ni-Fe-Cr ternary samples for various exciting energies with and without scattering and indicate that errors as large as 2% can be attributed to this effect.
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