Abstract
A new laboratory apparatus devoted to the characterization of various devices for the X-UV range (100-5000 eV), such as mirrors, diffraction gratings, spectrometers or detectors is described. The apparatus includes open x-ray tubes as x-ray sources, a two-crystal monochromator for wavelength selection and a goniometer. Various examples of its use are presented : dispersive mode where the radiation coming from the x-ray tube is dispersed by the two-crystal monochromator, spectrometric mode where the goniometer is used as a plane x-ray spectrometer and reflectometric mode where a selected wavelength is used to perform absolute reflectivity measurements.
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