Abstract
The electromagnetic scattering from two-dimensional two-layer dielectric random rough surfaces is analyzed in this work based on Monte Carlo (MC) simulations. The random rough surface is characterized with Gaussian statistics for surface correlation length and for surface root mean square (RMS) height. The Poggio-Miller-Chang-Harrington-Wu-Tsai (PMCHWT) surface integral equation is adopted and implemented. A rigorous three-dimensional (3-D) multilevel UV method combined with adaptive cross approximation (ACA) is proposed to solve for the unknown electric and magnetic surface currents. By calculating monostaitc statistical radar cross section (RCS) of the layered structure, the influence of the rough surface RMS height, the correlation length, the medium permittivity and the layer thickness on the scattering characteristic is investigated.
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