Abstract

Perfluoropentacene (PFP), an $n$-type organic semiconductor, is deposited at monolayer and bilayer coverage on Cu(111). Scanning tunneling microscopy at various bias voltages is used to investigate the geometric and electronic structure of the layer. The appearances of the first layer and second layer differ, probably because of perturbation to the first layer electronic structure by the substrate. This has been previously observed for pentacene (Pn), the isostructural $p$-type organic semiconductor. The PFP film has a unit cell of (4 -3,3 4) relative to the substrate, which is larger than that of Pn/Cu(111), representing a half-integer increment in each direction.

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