Abstract
In this paper, it is proposed to use modern research AMD-methods to monitor the properties of the subsurface layers of materials subjected to innovative technological treatments. They are based on the analysis of the parameters of acoustic waves reflected from the subsurface layers of the studied materials. The technological processing leads to a change in the acoustic characteristics, the value of which is calculated by the values of the parameters of the material of the samples. The effectiveness of the application of methods of acoustic-microscopic flaw detection for the analysis of the state of materials after thermal, chemical, deformation, and diffusion effects is demonstrated.
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