Abstract
We propose a model for the statistical design of a variable sample size chi-squared control chart (VSS χ2 control chart) for monitoring linear profiles. Performance measures of the proposed adaptive control chart are obtained through a Markov chain approach. Through a numerical example, which consists of a calibration application in a production process of semiconductors, the proposed chart is compared to the fixed parameter chi-squared control chart (FP χ2 chart) to monitor the intercept and slope of the linear profile. From this example, it is possible to assess the potential benefits provided by the proposed chart. Also, considering simultaneous shifts in the intercept, the slope, and the standard deviation, a sensitivity analysis of the proposed chart for monitoring linear profiles is presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: The International Journal of Advanced Manufacturing Technology
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
