Abstract
Grazing incidence x-ray reflectivity measurements are used to determine the density of sputter-deposited LaAlO3 and anodized LaAl films. Together with refractive index and dielectric constant measurements, it is demonstrated that a coherent picture emerges explaining the low dielectric constant of the amorphous films (∼13) as compared to the single-crystal value (∼26). The importance of molecular volume dependence of the electronic and vibrational molecular polarizabilities is underlined.
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