Abstract
The molecular structure of XeO4 has been investigated in the gas phase by electron diffraction. The data are completely compatible with the tetrahedral structure proposed from analysis of the infrared spectrum. Refinement of the structure by least squares based upon intensity functions, treating each distance and amplitude as independent parameters, yielded the results rXe–O = 1.736 Å (0.0023), rO...O = 2.832 Å (0.0086), lXe–O = 0.0468 Å (0.0025), and lO...O = 0.0866 Å (0.0076). Parenthesized values are 2σ and include estimates of systematic error.
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