Abstract
Molecular degradation in the electron microscope has been studied by energy loss spectroscopy, mass loss analysis and other techniques; none of these, however, have provided explicit information about the changes in the physical structure of the molecules. Here we present results from the use of inelastic electron tunneling spectroscopy as a probe in the study of degradation of molecular specimens in an electron microscope. The technique involves including the molecules of interest in a metal-insulatormetal junction and then monitoring the junctions current-voltage (I-V) characteristic. Explicitly, the measurement of d2I/dV2 vs. V provides a spectrum of vibrational frequencies (related to IR and Raman active modes) of the molecule; thus information about molecular bonds and physical configuration can be obtained. Upon electron irradiation, changes in the molecular structure are visible as changes in the heights and positions of the peaks in the tunneling spectrum.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
