Abstract
This paper presents a quantitative method used to determine the magnetocrystalline anisotropy constants of thin magnetic films from normalized magnetization data measured on a magneto-optic Kerr effect (MOKE) magnetometer. The method is based on a total magnetic energy density model, and incorporates higher order effects in the detected signal. By way of illustration, the method is used to determine the magnetocrystalline anisotropy constants of epitaxial thin Fe films on GaAs substrates, which have different overlayers. It is shown that a Cr overlayer on a 30 ML thick Fe film reduces the uniaxial contribution to the magnetic anisotropy compared with an Au overlayer.
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