Abstract
In current work, effects of rapid thermal annealing on the interface chemical bonding states, band alignment, and electrical properties of atomic-layer-deposition-derived HfAlO/Al2O3 gate stack on Si substrates have been studied by X-ray photoemission spectroscopy (XPS), UV–Vis transmission spectroscopy, and electrical measurements. XPS analyses have shown that HfAlO alloy and mixed silicate (Hf-Al-O-Si) increase after post-deposition annealing process. By means of UV–Vis transmission spectroscopy measurements, reduction in band gap for 400oC-annealed sample has been observed. Accordingly, reduction in the valence band offset and increase in the conduction band offset have been detected for HfAlO/Al2O3/Si gate stack annealed at 400 °C. Various current conduction mechanisms, such as Poole-Frenkel emission, Fowler-Nordheim (FN) tunneling, and space-charge-limited (SCL) conduction, have been analyzed. Detailed electrical measurements reveal that current conduct mechanisms is SCL conduction at lower field region and FN tunneling and SCL conduction are dominant conduction mechanism at higher field region.
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