Abstract
Comparisons are presented of room temperature modulated optical reflectance (MOR) and low temperature electron beam induced voltage contrast (EBIV) studies of thin film high temperature superconductor (HTS) microwave resonators. A strong correlation is shown between MOR and EBIV measurements showing MOR to provide a room temperature high spatial resolution indication of HTS properties. The relationship between microwave properties and film defects, revealed by MOR is discussed.
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