Abstract

Comparisons are presented of room temperature modulated optical reflectance (MOR) and low temperature electron beam induced voltage contrast (EBIV) studies of thin film high temperature superconductor (HTS) microwave resonators. A strong correlation is shown between MOR and EBIV measurements showing MOR to provide a room temperature high spatial resolution indication of HTS properties. The relationship between microwave properties and film defects, revealed by MOR is discussed.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call