Abstract

Electric propulsion systems, such as ion thrusters and Hall thrusters, are widely utilized in aerospace. The target indirect measurement method (TIMM) is a simple and robust way to measure its thrust. In general, one can obtain the thrust by scaling up the force exerted on the target surface immersed in the plume flow. However, the charge exchange (CEX) allows ions to become neutral particles, increasing the scaling coefficient. Meanwhile, the sputtered atoms and reflected incident particles exert force on the target surface and enlarge the measured thrust. In this study, the effects of the CEX, the sputtering, and the reflection on the TIMM are mathematically quantified, and then a modified model of the TIMM is proposed. Besides, the thrusts of the LIPS-200 and LIPS-300 ion thrusters were separately measured using the TIMM with the modified model, and the measured thrusts are in good agreement with the rated thrusts. Under the test conditions, the results of the LIPS-300 ion thruster show that the fast neutral atoms produced by the CEX account for more than 20% of all fast particles impacting on the target, and the force caused by the sputtered atoms is about 3.4% of the total force exerted on the target. We discuss how test conditions affect the CEX, sputtering, and reflection, thereby influencing the TIMM. The modified model was also validated through the simulation results, by showing that the measured thrust cannot be influenced by the test conditions.

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