Abstract
In this work, we present a procedure to modify the exchange bias (EB) properties of antiferromagnetic Mn/ferromagnetic NiFe bilayers by in-situ low energy Ar+ bombardment of the Mn layer during sample deposition. We present structural and magnetic results for unassisted and Ar+ assisted Mn/NiFe bilayers. X-ray diffraction, transmission electron microscopy and electron diffraction results establish different preferred Mn orientation directions between the two samples as a result of the Ar+ bombardment process. Hysteresis loops taken over several temperatures reveal that samples assisted with Ar+ ions during the Mn layer deposition had suppressed EB properties at low temperature as compared to samples grown without Ar+ assistance.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
