Abstract
A modified Michelson interferometer with external electrooptic phase control is presented. The device is a polarization interferometer, in which the reference and test arms are parts of the same collimated beam. The reference wave undergoes an odd number of reflections while the test wave is reflected an even number of times. As a consequence, the elliptical state of polarization of the reference wave will have opposite handedness in comparison with the state of polarization of the wave traveling through the test object. The phase shift between the two waves is externally controlled with a Pockels cell. This allows to make a very fast phase modulation.
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