Modified Early Generation Testing Procedure for Yield Selection in Soybean

Abstract

An early generation testing program to identify crosses with superior yield potential and F2 plants within these crosses which receive a superior complement of yield genes would be useful in soybean [Glycine max (L.) Merr.] breeding. Early generation testing is effective in identifying superior yielding pure lines, but requires extra yield testing. This paper describes a modified early generation testing procedure where the number of yield test plots required per cross has been reduced from 1860 to 175 plots, allowing a 10‐fold increase in the number of crosses that are evaluated per year. This was accomplished by reducing the number of F2‐derived lines per cross from 300 to 30 and by using single location, single replication data as a basis for selection in F2.3 through F2.4.6. This modified early generation testing procedure has been used in a soybean breeding program since 1972, resulting in the release of eight high‐yielding soybean cultivars.