Abstract
AbstractA novel resonance method for accurate determining a complex permittivity of the samples over the entire X‐band is proposed. This method uses the difference in the resonant mode perturbation when the sample moves in the field of standing wave of a rectangular resonator thereby leading to changing resonance frequencies and the amplitudes of resonant modes for each position of the sample in the resonator. Comparison of measured data with the calculated ones, in which permittivity (ε) and loss tangent (tan δ) are the variable parameters, allows for building the discrepancy coefficient σ as the function of ε and tan δ. Sought‐for values ε and tan δ of the sample are determined in points corresponding the minimа of the aforementioned functions. The procedure like that is used for all resonant modes excited in the resonator in the analyzed frequency band, which allows for obtaining the frequency dependences ε and tan δ. The measurements are carried out in the frequency band 8‐12 GHz for a number of solid dielectrics. Permittivity and loss tangent are determined with an error that does not exceed 0.5% and 5%, respectively.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
