Abstract
Test data compression is one of the major challenging tasks in VLSI. This paper targets on Test Data compression by using block based method without any variation in the system performance. Test data sets are separated into five kinds of blocks like whole zeros, whole ones, min zero/min one, max ones and complement blocks. The blocks will be read based on the presence of 0s and 1s. The analysis made in the ISCAS89 benchmark circuit shows that the proposed method is more efficient and more flexible and produces a good compression ratio when compared to the existing methods.
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