Modified Average Sample Number for Improved Double Sampling Plan Based on Truncated Life Test Using Exponentiated Distributions

Abstract

The reliability of the product has developed a dynamic issue in a worldwide business market. Generally acceptance sampling guarantees the superiority of the product. In acceptance sampling plan, increasing the sample size may lead to minimization of customers' risk of accepting bad lots and producers' risk of rejecting good lots to a certain level but will increase the cost of inspection. Hence truncation of life test time may be introduced to reduce the cost of inspection. Modified Average Sample Number (MASN) for Improved Double Sampling Plan (IDSP) based on truncated life test for popular exponentiated family such as exponentiated gamma, exponentiated lomax and exonentiated Weibull distribution are considered. The modified ASN creates a band width for average sample number which is much useful for the consumer and producer. The interval for average sample number makes the choice of consumer with a maximum and minimum sample size which is of much benefit without any loss for the producer. The probability of acceptance and average sample number based on modified double sampling plan for lower and upper limit is computed for the exponentiated family. Optimal parameters of IDSP under various exponentiated families with different shape parameters were computed. The proposed plan is compared over traditional double sampling and modified double sampling using Gamma distribution, Weibull distribution and Birnbaum-Saunders distribution and shows that the proposed plan with respect to exponentiated family performs better than all other plans. The tables were provided for all distributions. Comparative study of tables based on proposed exponentiated family and earlier existing plan are also done.