Abstract
Secondary ion mass spectrometry (SIMS) was used to measure in-depth distributions of a number of minor elements in the surfaces of aluminium electrodes after sparking in a spark source mass spectrometer (SSMS). The surface composition of the sparked electrodes was found to differ from that of the bulk. The secondary ion intensity ratios in the sparked surface and in the bulk, both normalized to the corresponding Fe + signal, agreed remarkably well with relative sensitivity factors (relative to Fe), which were experimentally determined for SSMS using homogeneous A1 standard reference materials. This suggests that differences in relative sensitivity factors are, at least to some extent, caused by a different behaviour of the corresponding constituents in the electrode surface during sparking.
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