Abstract
The Workshop on Modern Control and Industrial Electronics 2016 (MCIE) was held in Harbin, China, 19?20 January 2016 (Figure 1). MCIE 2016 was technically sponsored by the IEEE Industrial Electronics Society (IES) Technical Committee on Data-Driven Control and Monitoring. It was organized by the Research Institute of Intelligent Control and Systems of Harbin Institute of Technology (HIT) and the IES and IEEE Systems, Man, and Cybernetics Society Harbin Chapters. The workshop provided a wide platform for HIT students and researchers to learn the latest research results and exchange ideas with top-level researchers in the field of control and power electronics worldwide. The workshop enhanced the influence of IES at HIT as well as in northeast China. Around 150 researchers and students from different Chinese universities attended the workshop. Five world-renowned scientists were invited to deliver plenary talks:
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