Abstract

Phenomenological micromagnetic and large-scale magnetization-dependent models of resistivity that produce giant magnetoresistance in granular multilayer magnetic thin films are described. Included in the models are intralayer and interlayer scattering components formulated explicitly in terms of the microstructural properties and characteristic transport lengths of the medium. The micromagnetic model provides insight into the influence of the magnetization distribution on the giant magnetoresistance response of the medium. The large-scale model which is derived from the micromagnetic model, is useful for obtaining media transport parameters from experimental data. Both models are used to study a set of annealed NiFe/Ag multilayer films.

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