Abstract
Surveillance data on grain yield and diseases, insect pests and weeds from farmers' fields for two consecutive wet seasons (1981 and 1982) grouped into dwarf indica (dwarf) and tall indica (tall) rice varieties were subjected to multiple regression analysis. Equations having r 2 or R 2 ⩾ 0.60 are reported. Bacterial leaf streak alone explained 70% of yield variation in dwarf varieties, leaf blast and bacterial leaf streak together explained a yield variation of 74%. Brown spot and tungro diseases showed little increase in percentage yield variation in tall varieties. Among the insect pests, yellow stem borer alone could explain 69% yield variation in dwarf and 62% in tall varieties. Narrow-leaf weeds contributed more towards yield variation than did broad-leaf weeds. A combination of pests explained variations in yield better than did any individual pest.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.