Abstract
Flowgraph models are developed to describe relationships between thermal and electrical parameters of devices and associated circuits. Flowgraph techniques permit a systematic investigation of a wide range of device phenomena such as thermal feedback, thermal runaway and temperature induced drift. Figures of merit are derived for thermal sensitivity, and for thermal stability and are applied to temperature dependent parameter variations in transistors. Design criteria for compensation of thermal effects by associated circuits are evaluated by flowgraph techniques and flowgraph models serve to justify design limitations and design approximations based on thermal dependence.
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