Abstract
Recently, Porous Silicon (PS) is emerged as novel and unique material for the optoelectronic applications. In this work, modelling and analysis of one dimensional (1D) Photonic Crystals (PC) using PS is reported and these elements are suggested as the optical sensor device structures. Modelling is relying on the Bruggeman's Effective Medium Approximation (BEMA) and the Transfer Matrix Method (TMM) to design and predict the optical properties of 1D-PSPC structures. Wavelength shift (Δλ) in the reflectance spectrum is analyzed for the critical design parameters such as refractive index of void, layer thickness, layer porosity and refractive index of substrate. The engineering data reported are useful for the design of complex optoelectronic applications.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
