Abstract

Empirical models were developed to describe an observed relationship between Alternaria leaf blight and yield loss in muskmelon. Data used to develop and validate the models were obtained from replicated experimental field plots at two locations from 1988 to 1991. Area under disease progress curve, critical-point, and multiple-point models were derived and evaluated. All models provided a reasonably good fit to the data. However, a single area under disease progress curve model described losses at both locations, whereas separate critical-point and multiple-point models were necessary for each location (.)

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.