Abstract

This paper models the input non-quasi-static (NQS) effect of bipolar transistors using charge partitioning. The input NQS effect associated with the base minority carrier transport is modeled with a RC network, while the input NQS effect associated with the base-collector space charge region (CB SCR) carrier transport is modeled with a RLC network. With the proposed input NQS equivalent circuit model, Y-parameters and RF noise parameters using the van Vliet model are successfully modeled for frequencies up to f T . The transport noise model is extended to represent the van Vliet model by using two noise related time constants, which eliminates the need of Y-parameter in the description of the noise source. The input NQS effect for such model is verified to be important only for frequencies above f T /3. Analytical Y-parameter and noise solutions of a 1-D bipolar transistor at low injection level are used for validation.

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