MODELING THE DIELECTRIC RESPONSE IN HETEROGENEOUS MATERIALS USING 3D RC NETWORKS

Abstract

A model of 3D RC networks was developed to describe the dielectric response of heterogeneous materials and was compared with the results of the 2D RC network model. We show that the "universal dielectric response" (UDR) of heterogeneous materials is a common feature of both 2D and 3D very large networks with randomly positioned resistors and capacitors, and that the percolation threshold of the 2D and 3D bond network are close to 0.5 and 0.25, respectively. In addition, it was found that the percolation threshold of the 3D network is in good agreement with the result of the coherent potential (CP) formula.