Modeling of Voltage-Controlled Spin–Orbit Torque MRAM for Multilevel Switching Application

Abstract

Magnetic tunnel junction (MTJ) has emerged as a viable candidate for next-generation memory and logic applications. Manipulation of the magnetic and electric field can control the spin and charge state variables that are of utmost importance in spintronics devices. In this article, the modeling of voltage-controlled spin–orbit torque (VCSOT)-based magnetic random access memory (MRAM) is demonstrated. VCSOT MRAM is an ultrafast device owing to a magnetic switching time of 0.7 ns. It is more energy-efficient as compared to spin–orbit torque (SOT) MRAM. VCSOT MRAM has been exemplified for multilevel cell (MLC) application to enhance the memory integration density. Two-bit serial MLC (sMLC) and parallel MLC (pMLC) designs are proposed using VCSOT MRAM. These MLCs are more energy-efficient as compared to SOT-MLCs. Moreover, 2-bit sMLC and pMLC VCSOT-MRAM significantly reduce average write energy by 91.5% and 49.6%, respectively, as compared to SOT-based MLC. Performance metrics for these devices have been illustrated, which shows the negligible read disturbance and write error rates.